Scanning Electron Microscope
Revision as of 12:39, 14 October 2009 by Cmditradmin (talk | contribs)
Overview
The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs are able to focus the beam E-beam lithography or are equipped for focused ion beam (FIB) milling.
See Wikipedia on Scanning Electron Microscope
Operation
Training Video on Hitachi 3500H SEM at GT MiRC