Difference between revisions of "Scanning Electron Microscope"

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=== Operation ===
=== Operation ===
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Video in production
Video in production

Revision as of 16:44, 21 October 2009

Overview

Sirion sem.png

The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs have additioanal software enhancements than enable them to focus the beam on a photomask for E-beam lithography or are equipped for focused ion beam (FIB) milling.

See Wikipedia on Scanning Electron Microscope

Operation


Video in production

Training Manual for Sirion SEM[1]

Training Video on Hitachi 3500H SEM at GT MiRC

Significance

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