Difference between revisions of "Scanning Electron Microscope"
Jump to navigation
Jump to search
Cmditradmin (talk | contribs) m |
Cmditradmin (talk | contribs) m (→Operation) |
||
| Line 7: | Line 7: | ||
=== Operation === | === Operation === | ||
Video in production | |||
Training Manual for Sirion SEM[http://depts.washington.edu/cmditr/media/siriontraining_rev8_04223.pdf] | |||
Training Video on [http://grover.mirc.gatech.edu/training/viewVideo.php?video=sem-high&size=0 Hitachi 3500H SEM at GT MiRC] | Training Video on [http://grover.mirc.gatech.edu/training/viewVideo.php?video=sem-high&size=0 Hitachi 3500H SEM at GT MiRC] | ||
=== Significance === | === Significance === | ||
Revision as of 12:46, 14 October 2009
Overview
The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs are able to focus the beam E-beam lithography or are equipped for focused ion beam (FIB) milling.
See Wikipedia on Scanning Electron Microscope
Operation
Video in production
Training Manual for Sirion SEM[1]
Training Video on Hitachi 3500H SEM at GT MiRC