Difference between revisions of "Scanning Electron Microscope"
Jump to navigation
Jump to search
(New page: The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs are able to focus the beam E-beam lithog...) |
Cmditradmin (talk | contribs) m |
||
| Line 1: | Line 1: | ||
=== Overview === | |||
[[Image:Sirion_sem.png|thumb|300px|]] | |||
The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs are able to focus the beam E-beam lithography or are equipped for focused ion beam (FIB) milling. | The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs are able to focus the beam E-beam lithography or are equipped for focused ion beam (FIB) milling. | ||
See Wikipedia on [http://en.wikipedia.org/wiki/Scanning_electron_microscope Scanning Electron Microscope] | See Wikipedia on [http://en.wikipedia.org/wiki/Scanning_electron_microscope Scanning Electron Microscope] | ||
=== Operation === | |||
Training Video on [http://grover.mirc.gatech.edu/training/viewVideo.php?video=sem-high&size=0 Hitachi 3500H SEM at GT MiRC] | Training Video on [http://grover.mirc.gatech.edu/training/viewVideo.php?video=sem-high&size=0 Hitachi 3500H SEM at GT MiRC] | ||
=== Significance === | |||
Revision as of 12:39, 14 October 2009
Overview
The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs are able to focus the beam E-beam lithography or are equipped for focused ion beam (FIB) milling.
See Wikipedia on Scanning Electron Microscope
Operation
Training Video on Hitachi 3500H SEM at GT MiRC