Difference between revisions of "Femtosecond Z-Scan Spectrometer"
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=== Significance === | === Significance === | ||
The z-scan is based on the self-focusing effect. The index of refraction of a third order material changes as the intensity of the beam changes. As a sample through a focused beam the intensity of incident light increases to a point where the sample changes its index of refraction and alters the focus of the light which can be detected as a change in intensity of light passing through an aperature. | The z-scan is based on the self-focusing effect. The index of refraction of a third order material changes as the intensity of the beam changes. As a sample through a focused beam the intensity of incident light increases to a point where the sample changes its index of refraction and alters the focus of the light which can be detected as a change in intensity of light passing through an aperature. | ||
<div id="Flash">Z-Scan Spectrometer</div> <swf width="500" height="400">images/6/69/Z-scan.swf</swf> | |||
=== Operation === | === Operation === | ||
Revision as of 16:45, 10 March 2011
Background
The Femtosecond Z-Scan Spectrometer is used to measure extremely fast non-linear absorption and non-linear refraction. This provides are quick way of the electro-optic coefficient and Kerr non-linearity.
Significance
The z-scan is based on the self-focusing effect. The index of refraction of a third order material changes as the intensity of the beam changes. As a sample through a focused beam the intensity of incident light increases to a point where the sample changes its index of refraction and alters the focus of the light which can be detected as a change in intensity of light passing through an aperature.
Z-Scan Spectrometer
<swf width="500" height="400">images/6/69/Z-scan.swf</swf>