Ellipsometer
| Return to Research Tool Menu |
Overview
An elipsometer is used measure the dielectric properties (including refractive index and dielectric function) of thin films.
Significance
<math>\rho</math> (a complex quantity), which is the ratio of <math>r_p</math> over <math>r_s</math>:
- <math>\rho = \frac{r_p}{r_s} = \tan ( \Psi ) e^{i \Delta}</math>
Operation
Video on Woolam Ellipsometer at MiRC
Video on Woolam Ellipsometer at Cornell