Difference between revisions of "Ellipsometer"
Jump to navigation
Jump to search
Cmditradmin (talk | contribs) m (→Operation) |
Cmditradmin (talk | contribs) m |
||
| Line 8: | Line 8: | ||
An elipsometer is used measure the dielectric properties (including refractive index and dielectric function) of thin films. | An elipsometer is used measure the dielectric properties (including refractive index and dielectric function) of thin films. | ||
=== Significance === | === Significance === | ||
| Line 22: | Line 22: | ||
=== External Links === | === External Links === | ||
*[[wikipedia:Ellipsometry]] | *[[wikipedia:Ellipsometry]] | ||
*[http://www.jawoollam.com/tutorial_1.html Woolam Ellipsometry Tutorial] | |||
Revision as of 16:30, 21 September 2011
| Return to Research Tool Menu |
Overview
An elipsometer is used measure the dielectric properties (including refractive index and dielectric function) of thin films.
Significance
Operation
Video on Woolam Ellipsometer at MiRC
Video on Woolam Ellipsometer at Cornell