Scanning Electron Microscope

Overview

The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs have additional software enhancements than enable them to focus the beam on a photomask for E-beam lithography or are equipped for focused ion beam (FIB) milling.

See Wikipedia on Scanning Electron Microscope

Operation

Basic tour

(Remaining videos in production)

Training Manual for Sirion SEM[1]

Training Video on Hitachi 3500H SEM at GT MiRC