File:Angle resolved xps.jpg
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XPS is typically conducted with the sample perpendicular to the detector axis (normal takeoff angles) but if we want additional near-surface sensitivity we can tilt the sample. The above equation shows that tilting the sample gives us analytical information even closer to the surface
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 10:23, 22 April 2009 | | 960 × 720 (54 KB) | Cmditradmin (talk | contribs) | XPS is typically conducted with the sample perpendicular to the detector axis (normal takeoff angles) but if we want additional near-surface sensitivity we can tilt the sample. The above equation shows that tilting the sample gives us analytical informat |
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